Semiconductor memory device having advanced repair circuit

Details Semiconductor memory device having advanced repair circuit Semiconductor memory device having advanced repair circuit

2008-05-27

2008-05-27

Le, Thong Q. (Department: 2827)

Static information storage and retrieval

Read/write circuit

Bad bit

C365S194000, C365S230010

Reexamination Certificate

active

07379357

ABSTRACT:
A semiconductor device for comparing an input address with a repair address includes a signal controller for generating control signals. An address latch unit in response to the control signals latches the address. Each of N number of M-bit address comparators compares the address with the stored repair address. A comparator delay modeling block delays the control signal for a predetermined time, i.e., delay value of the M-bit address comparator. A repair circuit controller in response to the delayed control signal output from the comparator delay modeling block generates one of a repair address enable signal and a normal address enable signal based on a comparison result of the M-bit address comparator.

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