Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-05-27
2008-05-27
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07380222
ABSTRACT:
A method for performing verification is disclosed. The method includes selecting a set of gates to add to a first localization netlist and forming a refinement netlist. A min-cut is computed with sinks having one or more gates in the refinement netlist and sources comprising one or more inputs of an original netlist and one or more registers registers of the original netlist which are not part of the refinement netlist. A final localized netlist is obtained by adding one or more gates to the refinement netlist to grow the refinement netlist until reaching one or more cut-gates of the min-cut.
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Baumgartner Jason R.
Kanzelman Robert L.
Mony Hari
Paruthi Viresh
Chiang Jack
Dillon & Yudell LLP
International Business Machines - Corporation
Tat Binh
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