Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-08-30
2011-08-30
Pizarro, Marcos D. (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S315000, C257SE21209
Reexamination Certificate
active
08008706
ABSTRACT:
The present invention relates to a non-volatile memory cell and a method of fabricating the same. The non-volatile memory cell according to the present invention comprises a substrate, a first oxide film formed over an active region of the substrate, a source and drain formed within the active region, a charge storage unit formed on the first oxide film, a second oxide film configured to surround the charge storage unit and formed on the first oxide film, and a gate formed to surround the second oxide film. According to the non-volatile memory cell and a cell array including the same in accordance with the present invention, the charge storage unit is fully surrounded by the gate or the gate line, thus a disturbance phenomenon that may occur due to the memory operation of cells formed in other neighboring gate or gate line can be minimized.
REFERENCES:
patent: 2004/0238879 (2004-12-01), Endoh et al.
patent: 2007/0004137 (2007-01-01), Oh et al.
Choi Yang-Kyu
Kim Kuk-Hwan
Korea Advanced Institute of Science and Technology
Montalvo Eva Yan
Pizarro Marcos D.
The Belles Group P.C.
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