Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2008-01-29
2008-01-29
Connolly, Patrick (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S521000, C250S23700G
Reexamination Certificate
active
07324212
ABSTRACT:
An optical encoder includes a source of a light beam, an optical grating that generates a spatial pattern of interference fringes, and an optical detector which includes generally elongated detector elements that sample the interference fringe pattern at spatially separated locations along the direction of motion of the grating. Each detector element has one or more segments slanted along the direction of motion of the grating by an integer multiple of the period of an undesirable harmonic component of the fringe pattern, thereby spatially integrating the harmonic component and suppressing its contribution to an output of the detector. One specific detector type includes parallel elongated rectangular elements in a rectangular array that is rotated slightly about a Z axis; another type includes detector elements arranged to form a non-rectangular parallelogram. Another type of detector includes detector elements that each have multiple elongated rectangular segments which may be arranged into two non-parallel sets. The two sets can be further arranged in an alternating fashion so as to impart a zig-zag or chevron shape to each detector element.
REFERENCES:
patent: 4595991 (1986-06-01), Spies
patent: 4782229 (1988-11-01), Ernst
patent: 5486923 (1996-01-01), Mitchell et al.
patent: 5530543 (1996-06-01), Hercher
patent: 5559600 (1996-09-01), Mitchell
patent: 5604345 (1997-02-01), Matsuura
patent: 5646730 (1997-07-01), Mitchell et al.
patent: 5814812 (1998-09-01), Holzapfel
patent: 5874729 (1999-02-01), Holzapfel
patent: 5889280 (1999-03-01), Matsuura
patent: 5981942 (1999-11-01), Ieki
patent: 5991249 (1999-11-01), Lee
patent: 5994692 (1999-11-01), Holzapfel
patent: 6094307 (2000-07-01), Ieki
patent: 6392224 (2002-05-01), Holzapfel et al.
patent: 6528783 (2003-03-01), Mortara et al.
patent: 6723980 (2004-04-01), Lee
patent: 7002137 (2006-02-01), Thorburn et al.
patent: 7067797 (2006-06-01), Mitchell et al.
patent: 7084390 (2006-08-01), Mayer
patent: 2001/0017349 (2001-08-01), Holzapfel et al.
patent: 2002/0008195 (2002-01-01), Aoki et al.
patent: 2003/0010906 (2003-01-01), Lee
patent: 2003/0047673 (2003-03-01), Thorburn et al.
patent: 2003/0048536 (2003-03-01), Aoki
patent: 2003/0085345 (2003-05-01), Franklin et al.
patent: 2004/0046113 (2004-03-01), Mayer et al.
patent: 2005/0051716 (2005-03-01), Mayer
patent: 3616144 (1987-11-01), None
patent: 195 05 176 (1995-08-01), None
patent: 0694764 (1996-01-01), None
patent: WO 03/021197 (2003-03-01), None
De Groot, Peter, “Derivation of algorithms for phase-shifting interferometry using the concept of a data-sampling window” Applied Optics, vol. 34, No. 22, pp. 4723-4730 (1995).
Mitchell Donald K.
Thorburn William G.
BainwoodHuang
Connolly Patrick
GSI Group Corporation
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