Semiconductor memory device with magnetoresistance elements...

Static information storage and retrieval – Systems using particular element – Magnetoresistive

Reexamination Certificate

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C365S173000, C257S241000

Reexamination Certificate

active

07355885

ABSTRACT:
A semiconductor memory device includes memory cells, first wirings, a first current driver circuit, and a second current driver circuit. The memory cell includes a magneto-resistive element having a first ferromagnetic film, an insulating film formed on the first ferromagnetic film, and a second ferromagnetic film formed on the insulating film. The first wiring is provided in close proximity to and insulated from the magneto-resistive element. The first current driver circuit supplies a first current to the first wiring in a write operation to produce a magnetic field around the magneto-resistive elements. The second current driver circuit supplies a second current between the first and second ferromagnetic films via the insulating film in a write and a read operation.

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Roy Scheuerlein, et al., “A 10ns Read and Write Non-Volatile Memory Array Using a Magnetic Tunnel Junction and FET Switch in Each Cell”, ISSCC 2000, Session 7, TD: Emerging Memory & Device Technologies, Pater TA 7.2, pp. 128-129.
Masashige Sato, et at., “Spin-Valve-Like Properties of Perromagnetic Tunnel Junctions”, Jpn. J. Appl. Phys., vol. 36, Part 2, No. 2B, Feb. 15, 1997, pp. L200-L201.
R.S. Beech, et al. “Curie Point Written Magnetoresistive Memory” Journal of Applied Physics, vol. 87, No. 9, May 1, 2000, pp. 6403-6405.

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