Semiconductor device including a contact connected to the...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S155000, C257SE27112, C257SE29147, C257SE29148

Reexamination Certificate

active

07402865

ABSTRACT:
A Schottky junction is formed at the connection between an SOI layer and a contact (namely, under an element isolation insulating film) without forming a P+region with a high impurity concentration thereat. The surface of a body contact is provide with a barrier metal. A silicide is formed between the body contact and the SOI layer as a result of the reaction of the barrier metal and the SOI layer.

REFERENCES:
patent: 5559368 (1996-09-01), Hu et al.
patent: 5818085 (1998-10-01), Hsu et al.
patent: 6252280 (2001-06-01), Hirano
patent: 6337230 (2002-01-01), Hirano
patent: 6429487 (2002-08-01), Kunikiyo
patent: 6815296 (2004-11-01), Dennard et al.
patent: 1334605 (2002-02-01), None
patent: 6-204334 (1994-07-01), None
patent: 2001-77368 (2001-03-01), None
S. Maeda, et al, “Impact of 0.18μm SOI CMOS Technology Using Hybrid Trench Isolation with High Resistivity Substrate on Embedded RF/Analog Applications”, Symposium on VLSI Technology Digest of Technical Papers, IEEE 2000, pp. 154-155.

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