Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate
2008-07-22
2008-07-22
Ho, Hoai V. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Data refresh
C365S211000
Reexamination Certificate
active
07403440
ABSTRACT:
An electronic memory apparatus has a plurality of memory devices, a plurality of temperature sensors and a control unit. The memory devices each have a multiplicity of nonvolatile memory cells that are refreshed during operation of the electronic memory apparatus. The control unit passes a same periodic clock signal to each of the memory devices. The clock signal causes the memory cells to be refreshed in the memory devices. Each temperature sensor is associated with a respective memory device and measures a local temperature near the respective memory device during operation. Each memory device individually determines, on the basis of the temperature measured by the temperature sensor that is assigned to it, how many of its memory cells are simultaneously refreshed when memory cells are being refreshed.
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Ho Hoai V.
Infineon - Technologies AG
Slater & Matsil L.L.P.
Tran Anthan T
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