Semiconductor nonvolatile memory device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S390000, C257SE29129, C257SE21680

Reexamination Certificate

active

07323741

ABSTRACT:
A low cost semiconductor nonvolatile memory device capable of high speed programming, using an inversion layer as the wiring, and a manufacturing method for that device. The semiconductor memory device includes an auxiliary electrode at a position between and in parallel with the source and drain regions and with no position overlap versus the source region and the drain region formed mutually in parallel; wherein the auxiliary electrode for hot electron source injection is utilized as the auxiliary electrode for programming (writing); and an inversion layer formed below the auxiliary electrode is utilized as the source region or as the drain region during the read operation.

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T. Kobayashi et al., “A Giga-Scale Assist Gate (AG)-AND-Type Flash Memory Cell with 20-MB/s Programming Throughput for Content-Downloading Applications”, 2001 IEEE, pp. 29-32.

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