Graphic contour extracting method, pattern inspecting...

Details Graphic contour extracting method, pattern inspecting... Graphic contour extracting method, pattern inspecting...

2008-01-22

2008-01-22

Chawan, Sheela (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S241000, C382S199000, C700S187000

Reexamination Certificate

active

07321680

ABSTRACT:
A graphic contour extracting method includes: acquiring an image of a graphic form to be inspected; defining an inspection region for the image of the graphic form to be inspected by an inspection graphic form including at least one of a circle, an ellipse, a rectangle, a first rectangular graphic form, a second rectangular graphic form and a closed curved graphic form, at least one end of the first rectangular graphic form being replaced with any one of a semi-circle, a semi-ellipse and a parabola, at least one of four corners of the second rectangular graphic form being replaced with a ¼ circle or a ¼ ellipse, the closed curved graphic form being expressed by the following expression:(x-x0)4a4+(y-y0)4b4=1,and the inspection graphic form having an edge searching direction previously defined for at least one component thereof; and searching an edge of the graphic form to be inspected on the basis of the inspection graphic form to acquire contour information of the graphic form to be inspected.

REFERENCES:
patent: 4804831 (1989-02-01), Baba et al.
patent: 5065344 (1991-11-01), Kishimoto et al.
patent: 5131755 (1992-07-01), Chadwick et al.
patent: 5572602 (1996-11-01), Naoi et al.
patent: 6173070 (2001-01-01), Michael et al.
patent: 6263089 (2001-07-01), Otsuka et al.
patent: 6335985 (2002-01-01), Sambonsugi et al.
patent: 6480807 (2002-11-01), Miyano
patent: 6639685 (2003-10-01), Gu et al.
patent: 6774905 (2004-08-01), Elfving et al.
patent: 6850875 (2005-02-01), Claffey et al.
patent: 7-27548 (1995-01-01), None
patent: 2001-91231 (2001-04-01), None

Affiliated with

Also associated with

Rating

Graphic contour extracting method, pattern inspecting... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Graphic contour extracting method, pattern inspecting..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Graphic contour extracting method, pattern inspecting... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2754842