4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Yumiko Miyano

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Graphic contour extracting method, pattern inspecting...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Graphic contour extracting method, pattern inspecting...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Graphic contour extracting method, pattern inspecting...

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
Reexamination Certificate

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Method for measuring fine pattern, apparatus for measuring...

Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate

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Method for measuring size of fine pattern

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2362651

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