Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – With means to increase breakdown voltage threshold

Reexamination Certificate

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Details

C257S488000, C257S491000, C257S492000, C257S493000, C257S339000

Reexamination Certificate

active

07973382

ABSTRACT:
A gate electrode20and first field plates22ato22dand23are provided on a field oxide film19. The gate electrode20and first field plates22ato22dand23are covered with an insulating film24. A high-voltage wiring conductor28is provided on the insulating film24. A shielding electrode29is provided between the first field plate22apositioned closest to a source side and the high-voltage wiring conductor28.

REFERENCES:
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patent: 6150702 (2000-11-01), Funaki et al.
patent: 6307232 (2001-10-01), Akiyama et al.
patent: 6507085 (2003-01-01), Shimizu
patent: 6844613 (2005-01-01), Shimizu
patent: 6879005 (2005-04-01), Yamaguchi et al.
patent: 2005/0194656 (2005-09-01), Shimizu
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patent: 3-49265 (1991-03-01), None
patent: 3-235367 (1991-10-01), None
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patent: 2004-179496 (2004-06-01), None
patent: 2005-251903 (2005-09-01), None
K. Shimizu, et al., “A 600V HVIC Process with a built-in EPROM which enables new concept Gate Driving”, ISPSD '04 (Proceedings of the 16thInternational Symposium on Power Semiconductor Devices & ICs), May 24-27, 2004, 5 pages.
U.S. Appl. No. 12/685,180, filed Jan. 11, 2010, Takahashi, et al.

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