Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-04-26
2011-04-26
Parker, Kenneth A (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S315000, C257S534000, C257SE29201
Reexamination Certificate
active
07932554
ABSTRACT:
A semiconductor device having a modified recess channel gate includes active regions defined by a device isolation layer and arranged at regular intervals on a semiconductor substrate, each active region extending in a major axis and a minor axis direction, a trench formed in each active region, the trench including a stepped bottom surface in the minor axis direction of the active region, and a recess gate formed in the trench.
REFERENCES:
patent: 6239465 (2001-05-01), Nakagawa
patent: 2005/0042833 (2005-02-01), Park et al.
patent: 2005/0087776 (2005-04-01), Kim
patent: 2006/0118889 (2006-06-01), Suh
patent: 2006/0128138 (2006-06-01), Xin
patent: 2006/0211203 (2006-09-01), Kim et al.
patent: 2006/0273381 (2006-12-01), Kim et al.
patent: 1020040051931 (2004-06-01), None
patent: 1020060039366 (2006-05-01), None
Hynix / Semiconductor Inc.
Marshall & Gerstein & Borun LLP
Page Dale
Parker Kenneth A
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