Semiconductor device and method of fabricating the same

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S365000, C257SE27060, C257SE21626, C438S275000

Reexamination Certificate

active

07932564

ABSTRACT:
A semiconductor device according to an embodiment includes: a fin type MOSFET having a first gate electrode, and a first gate insulating film for generating Fermi level pinning in the first gate electrode; and a planar type MOSFET having a second gate electrode, and a second gate insulating film for generating no Fermi level pinning in the second gate electrode, or generating Fermi level pinning weaker than that generated in the first gate electrode in the second gate electrode.

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H. Kawasaki, “Embedded Bulk FinFET SRAM Cell Technology with Planar FET Peripheral Circuit forhp32 nm node and beyond”, Symposium on VLSI Technology Digest of Techical Papers, 2006 IEEE, pp. 86-87.

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