Method and apparatus for improving memory operation and yield

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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C714S764000

Reexamination Certificate

active

07962809

ABSTRACT:
A memory circuit includes a memory interface including an address line and a data line. A first memory is configured to i) receive addresses transmitted on the address line of the memory interface and ii) output data in response to the addresses. Content addressable memory (CAM) is configured to i) monitor the addresses transmitted on the address line of the memory interface and ii) output error correction coding (ECC) bits in response to the addresses. An ECC circuit is configured to receive the ECC bits and the data. The memory interface is configured to selectively receive, via the data line of the memory interface, one of the data from the first memory and an output of the ECC circuit.

REFERENCES:
patent: 4205301 (1980-05-01), Hisazawa
patent: 4901360 (1990-02-01), Shu et al.
patent: 4903268 (1990-02-01), Hidaka et al.
patent: 5056095 (1991-10-01), Horiguchi et al.
patent: 5127014 (1992-06-01), Raynham
patent: 5475825 (1995-12-01), Yonezawa et al.
patent: 5485595 (1996-01-01), Assar et al.
patent: 5491703 (1996-02-01), Barnaby et al.
patent: 5513135 (1996-04-01), Dell et al.
patent: 5535226 (1996-07-01), Drake et al.
patent: 5629898 (1997-05-01), Idei et al.
patent: 5636354 (1997-06-01), Lear
patent: 5642230 (1997-06-01), Jang
patent: 5758056 (1998-05-01), Barr
patent: 5796758 (1998-08-01), Levitan
patent: 5848076 (1998-12-01), Yoshimura
patent: 5890201 (1999-03-01), McLellan et al.
patent: 5958068 (1999-09-01), Arimilli et al.
patent: 5958079 (1999-09-01), Yoshimura
patent: 5959914 (1999-09-01), Gates et al.
patent: 5973949 (1999-10-01), Kramer et al.
patent: 6000006 (1999-12-01), Bruce et al.
patent: 6041422 (2000-03-01), Deas
patent: 6058047 (2000-05-01), Kikuchi
patent: 6065141 (2000-05-01), Kitagawa
patent: 6067656 (2000-05-01), Rusu et al.
patent: 6085334 (2000-07-01), Giles et al.
patent: 6134631 (2000-10-01), Jennings, III
patent: 6175941 (2001-01-01), Poeppelman et al.
patent: 6233646 (2001-05-01), Hahm
patent: 6237116 (2001-05-01), Fazel et al.
patent: 6275406 (2001-08-01), Gibson et al.
patent: 6295617 (2001-09-01), Sonobe
patent: 6331961 (2001-12-01), Kengeri et al.
patent: 6385071 (2002-05-01), Chai et al.
patent: 6414876 (2002-07-01), Harari et al.
patent: 6438726 (2002-08-01), Walters, Jr.
patent: 6457154 (2002-09-01), Chen et al.
patent: 6484271 (2002-11-01), Gray
patent: 6563754 (2003-05-01), Lien et al.
patent: 6597595 (2003-07-01), Ichiriu et al.
patent: 6700827 (2004-03-01), Lien et al.
patent: 6751755 (2004-06-01), Sywyk et al.
patent: 6778457 (2004-08-01), Burgan
patent: 6799246 (2004-09-01), Wise
patent: 6898140 (2005-05-01), Leung et al.
patent: 7017089 (2006-03-01), Huse
patent: 7051151 (2006-05-01), Perego et al.
patent: 7062597 (2006-06-01), Perego et al.
patent: 7065622 (2006-06-01), Donnelly et al.
patent: 7073099 (2006-07-01), Sutardja et al.
patent: 7216284 (2007-05-01), Hsu et al.
patent: 7308530 (2007-12-01), Armstrong et al.
patent: 7809998 (2010-10-01), Sutardja et al.
patent: 7814382 (2010-10-01), Sutardja et al.
patent: 7823030 (2010-10-01), Sutardja et al.
patent: 2001/0032296 (2001-10-01), Nishimukai et al.
patent: 2001/0048625 (2001-12-01), Patti et al.
patent: 2002/0004873 (2002-01-01), Kawaguchi
patent: 2004/0218439 (2004-11-01), Harrand et al.
patent: 2004/0243886 (2004-12-01), Klein
patent: 2006/0158950 (2006-07-01), Klein
patent: 2008/0307301 (2008-12-01), Decker et al.
“Functional testing of content-addressable memories” by Lin et al. This paper appears in: Memory Technology, Design and Testing, 1998. Proceedings. International Workshop on Publication Date: Aug. 24-25, 1998 On pp. 70-75 ISBN: 0-8186-8494-1 Inspec Accession No. 6142197.
“Testing and diagnosing embedded content addressable memories” by Li et al. This paper appears in: VLSI Test Symposium, 2002. Proceedings 20th IEEE Publication Date: Apr. 28-May 2, 2002 On pp. 389-394 ISBN: 0-7695-1570-3 Inspec Accession No. 7361019.
“Fully-parallel multi-megabit integrated CAM/RAM design” by Schultz et al. This paper appears in: Memory Technology, Design and Testing, 1994., Records of the IEEE International Workshop on Publication Date: Aug. 8-9, 1994 On pp. 46-51 ISBN: 0-8186-6245-X Inspec Accession No. 4933182.
“Fault-tolerant content addressable memory” by Lo, J.-C. This paper appears in: Computer Design: VLSI in Computers and Processors, 1993. ICCD '93. Proceedings., 1993 IEEE International Conference on Publication Date: Oct. 3-6, 1993 On pp. 193-196 ISBN: 0-8186-4230-0 Inspec Accession No. 4955866.
Notification of Transmittal of The International Search Report and The Written Opinion of The International Searching Authority, or The Declaration dated May 27, 2008 in reference to PCT/US2007/016661 (21 pgs).
“FBDIMM—Unleashing Server Memory Capacity”; Micron Technology, Inc.; 2006; 2 pages.
Bigger, Better, Faster . . . Improve server performance with Crucial fully buffered DIMMs; Andy Heidelberg of Crucial Technology; 6 pages.
“Memory Built-in Self-repair Using Redundant Words” Schober et al. International Test Conference Proceedings. Publication Date: Oct. 30-Nov. 1, 2001 pp. 995-1001 Inspec Accession No. 7211400.
IBM TDB NN85112562 “System for Efficiently Using Spare Memory Components for Defect Corrections Employing Content-Addressable Memory” Date: Nov. 1, 1985.
McAuley et al. “A Self-Testing Reconfigurable CAM.” Solid-State Circuits, IEEE Journal vol. 26. Issue 3 (Mar. 1991): pp. 257-261.
Noghani et al. “Design Rule Centering for Row Redundant Content Addressable Memories.” Defect and Fault Tolerance in VLSI Systems, Proceedings., 1992 IEEE International Workshop (Nov. 4-6, 1992): pp. 217-226.
Youngs et al. “Mapping and Repairing Embedded-Memory Defects.” Design & Test Computers, IEEE vol. 14. Issue 1 (Jan.-Mar. 1997): pp. 18-24.
Delgado-Frias, Jose G. et al. “A VLSI Interconnection Network Router Using a D-CAM with Hidden Refresh.” (Sixth Great Lakes Symposium on Mar. 22-23, 1996): pp. 246-251.

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