Process reflection

Details Process reflection Process reflection

2011-03-15

2011-03-15

Duncan, Marc (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C717S127000

Reexamination Certificate

active

07908521

ABSTRACT:
Process reflection techniques are described in which a reflected process is created to facilitate analysis of a process. Events are detected to initiate reflection of a target process. Process reflection of a target process may be initiated by an external process or by the target process itself. A reflected process of the target process is created. In an implementation, data defining the target process is replicated, copied, or otherwise collected from the target process to create the reflected process. Then, analysis may be performed on the reflected process while execution of the target process continues.

REFERENCES:
patent: 6094530 (2000-07-01), Brandewie
patent: 6161193 (2000-12-01), Garg et al.
patent: 6195765 (2001-02-01), Kislanko et al.
patent: 6219828 (2001-04-01), Lee
patent: 6560629 (2003-05-01), Harris
patent: 6988264 (2006-01-01), Sarma et al.
patent: 7020800 (2006-03-01), Fu et al.
patent: 7284156 (2007-10-01), Creamer et al.
patent: 7313599 (2007-12-01), Maeda et al.
patent: 7555744 (2009-06-01), Chkodrov et al.
patent: 7613597 (2009-11-01), Vertes
patent: 2004/0215998 (2004-10-01), Buxton et al.
patent: 2004/0221269 (2004-11-01), Ray et al.
patent: 2005/0097399 (2005-05-01), Bliss et al.
patent: 2006/0101189 (2006-05-01), Chandrasekaran et al.
patent: 2009/0150885 (2009-06-01), Safari et al.
Douglis et al., “Transparent Process Migration: Design Alternatives and the Sprite Implementation”, vol. 21(8), John Wiley & Sons, Ltd., 1991, pp. 757-785.
McKeith, “DSClone—A New Tool for Disaster Recovery”,Mar. 18, 2005, Retrieved at <<http://www.novell.com/coolsolutions/feature/11574.html>>, pp. 1-4.
Vrenios, “Process Cloning in C”, retrieved at <<http://linuxgazette.net/issue51/vrenios.html>>, Alex Vrenios, 2000, pp. 1-3.

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