Low work function, stable thin films

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438482, 438483, 438484, 438485, 438486, 117904, 117 3, H01L 2120

Patent

active

061627070

ABSTRACT:
Generation of low work function, stable compound thin films by laser ablation. Compound thin films with low work function can be synthesized by simultaneously laser ablating silicon, for example, and thermal evaporating an alkali metal into an oxygen environment. For example, the compound thin film may be composed of Si/Cs/O. The work functions of the thin films can be varied by changing the silicon/alkali metal/oxygen ratio. Low work functions of the compound thin films deposited on silicon substrates were confirmed by ultraviolet photoelectron spectroscopy (UPS). The compound thin films are stable up to 500.degree. C. as measured by x-ray photoelectron spectroscopy (XPS). Tests have established that for certain chemical compositions and annealing temperatures of the compound thin films, negative electron affinity (NEA) was detected. The low work function, stable compound thin films can be utilized in solar cells, field emission flat panel displays, electron guns, and cold cathode electron guns.

REFERENCES:
patent: 5726524 (1998-03-01), Debe
patent: 5886459 (1999-03-01), Auciello et al.
patent: 6019913 (2000-01-01), Dinh et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Low work function, stable thin films does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Low work function, stable thin films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Low work function, stable thin films will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-270776

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.