Semiconductor fin based nonvolatile memory device and method...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S316000

Reexamination Certificate

active

07898021

ABSTRACT:
A semiconductor structure and a method for fabricating the semiconductor structure include a semiconductor fin having a first side and a second side opposite the first side. A first gate dielectric and a charge storage layer are successively layered upon the first side of the semiconductor fin. A second gate dielectric and a gate electrode are layered upon the second side and the charge storage layer. The semiconductor structure comprises a nonvolatile semiconductor device.

REFERENCES:
patent: 6445032 (2002-09-01), Kumar et al.
patent: 6903967 (2005-06-01), Mathew et al.
patent: 6933558 (2005-08-01), Hill et al.
patent: 6963104 (2005-11-01), Wu et al.
patent: 7087952 (2006-08-01), Zhu et al.
Kumar et al., “Scaling of Flash NVRAM to 10's of nm by Decoupling of Storage From Read/Sense Using Back-Floating Gates,” IEEE Transactions on Nanotechnology, vol. 1, No. 4, Dec. 2002, pp. 247-254.

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