Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-03-01
2011-03-01
Menz, Douglas M (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S316000
Reexamination Certificate
active
07898021
ABSTRACT:
A semiconductor structure and a method for fabricating the semiconductor structure include a semiconductor fin having a first side and a second side opposite the first side. A first gate dielectric and a charge storage layer are successively layered upon the first side of the semiconductor fin. A second gate dielectric and a gate electrode are layered upon the second side and the charge storage layer. The semiconductor structure comprises a nonvolatile semiconductor device.
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Kumar et al., “Scaling of Flash NVRAM to 10's of nm by Decoupling of Storage From Read/Sense Using Back-Floating Gates,” IEEE Transactions on Nanotechnology, vol. 1, No. 4, Dec. 2002, pp. 247-254.
Luo Zhijiong
Zhu Huilong
International Business Machines - Corporation
Menz Douglas M
Schnurmann H. Daniel
Scully , Scott, Murphy & Presser, P.C.
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