Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2011-08-09
2011-08-09
Pham, Long (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C438S154000, C438S157000, C438S597000, C438S655000, C438S664000
Reexamination Certificate
active
07993992
ABSTRACT:
There is disclosed a method of fabricating TFTs having reduced interconnect resistance by having improved contacts to source/drain regions. A silicide layer is formed in intimate contact with the source/drain regions. The remaining metallization layer is selectively etched to form a contact pad or conductive interconnects.
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Office Action (Application No. 08-307443) with partial translation, Oct. 5, 2004, 7 pages.
Fujimoto Etsuko
Ohtani Hisashi
Fish & Richardson P.C.
Pham Long
Semiconductor Energy Laboratory Co,. Ltd.
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