Method for manufacturing an interconnection structure with...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21581, C438S411000, C438S422000

Reexamination Certificate

active

07960275

ABSTRACT:
A method for manufacturing a structure of electrical interconnections for an integrated circuit having levels of interconnections, the method having steps of depositing a layer of sacrificial material on the substrate, etching the layer of sacrificial material with a pattern corresponding to electrical conductors, depositing, on the etched layer of the layer of sacrificial material, a layer of permeable membrane allowing an attack agent to break down the sacrificial material, breaking down the sacrificial material by using the attack agent to form air gaps to replace the broken down sacrificial material, forming electrical conductors in the etched track so as to obtain electrical interconnections separated by air gaps, and depositing a layer of insulating material to cover the electrical interconnections.

REFERENCES:
patent: 6261942 (2001-07-01), Zhou et al.
patent: 6509623 (2003-01-01), Zhao
patent: 6610593 (2003-08-01), Kohl et al.
patent: 7510959 (2009-03-01), Daamen et al.
patent: 2004/0137728 (2004-07-01), Gallagher et al.
patent: 2005/0037604 (2005-02-01), Babich et al.
patent: 2006/0006538 (2006-01-01), Allman et al.
patent: 2006/0216920 (2006-09-01), Kojima
patent: 2008/0185722 (2008-08-01), Liu et al.
K. Schulze, et al., “Formation of Air Gap Structures via wet etch removal of sacrificial dielectrics”, Advanced Metallization Conference 2005 (AMC 2005), XP-008084926, 1 front page, pp. 309-316.
F. Gaillard, et al., “Chemical etching solutions for air gap formation using a sacrificial oxide/polimer approach”, Microelectronic Engineering, vol. 83, No. 11-12, XP-002455759, Nov. 2006, pp. 2309-2313.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing an interconnection structure with... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing an interconnection structure with..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing an interconnection structure with... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2691590

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.