Method of programming a memory device of the one-time...

Static information storage and retrieval – Systems using particular element – Capacitors

Reexamination Certificate

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C365S094000, C365S096000, C365S102000

Reexamination Certificate

active

07978502

ABSTRACT:
A memory device of the irreversibly electrically programmable type is provided with a memory cell having a dielectric zone disposed between a first electrode and second electrode. An access transistor is connected in series with the second electrode, and an auxiliary transistor is connected in series with the first electrode. The auxiliary transistor is biased to have a saturation current which is lower than a saturation current of the access transistor when both the auxiliary and access transistors are actuated. A number of the memory cells are arranged in a memory plane to form the memory device.

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patent: 1 351 255 (2003-10-01), None
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patent: WO 2006/017416 (2006-02-01), None
patent: WO 2007/040847 (2007-04-01), None
Preliminary French Search Report, FR 0852354, dated Oct. 31, 2008.
Barsatan, Randy et al., “A Zero-Mask One-Time Programmable Memory Array for RFID Applications”, 0-7803-9390-2/06/$20.00, 2006, IEEE, pp. 975-978.
Candelier, Philippe et al., “One Time Programmable Drift Antifuse Cell Reliability”, IEEE 00CH37059, 38th Annual International Reliability Physics Symposium, San Jose, California, 2000, pp. 169-173.
Kim, Jinbong et al., “Three-Transistor One-Time Programmable (OTP) ROM Cell Array Using Standard CMOS Gate Oxide Antifuse”, 0741-3106/03$17.00, 2003, IEEE, pp. 589-591.

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