Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate
2011-03-22
2011-03-22
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Data refresh
C365S201000
Reexamination Certificate
active
07911868
ABSTRACT:
A self-refresh period measurement circuit of a semiconductor device is disclosed, herein which includes a period measurement start signal generator configured to receive a self-refresh signal and an oscillation signal, to allow a self-refresh operation to be performed, and generate a period measurement start signal, to set the time that the oscillation signal is enabled, and a refresh period output unit configured to receive the period measurement start signal and the oscillation signal, and generate a refresh period output signal that is enabled for a period from the time that the period measurement start signal is enabled to a time that the oscillation signal is enabled.
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Cooper & Dunham LLP
Hynix / Semiconductor Inc.
Phung Anh
White John P.
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