Method of forming nitride film and nitride structure

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21090, C257SE21110, C117S088000

Reexamination Certificate

active

07943492

ABSTRACT:
A method of forming a nitride film by hydride vapor phase epitaxy, the method including: sequentially disposing at least one group III metal source including impurities and a substrate in an external reaction chamber and an internal reaction chamber sequentially located in the direction of gas supply and heating each of the external reaction chamber and the internal reaction chamber at a growth temperature; forming a metal chloride by supplying hydrogen chloride gas and carrier gas into the external reaction chamber to react with the group III metal source and transferring the metal chloride to the substrate; and forming the nitride film doped with the impurities on the substrate by reacting the transferred metal chloride with nitrogen source gas supplied to the internal reaction chamber.

REFERENCES:
patent: 3933538 (1976-01-01), Akai et al.
patent: 5923054 (1999-07-01), Kobashi et al.
patent: 6218269 (2001-04-01), Nikolaev et al.
patent: 6508879 (2003-01-01), Hashimoto
patent: 6533874 (2003-03-01), Vaudo et al.
patent: 2002/0177312 (2002-11-01), Tsvetkov et al.
patent: 2005/0077537 (2005-04-01), Seong et al.
patent: 2005/0142391 (2005-06-01), Dmitriev et al.
patent: 2005/0153471 (2005-07-01), Sasaki et al.
patent: 2006/0071234 (2006-04-01), Irikura et al.
patent: 2006/0273343 (2006-12-01), Nakahata et al.
patent: 2006/0280668 (2006-12-01), Dmitriev et al.
patent: 2007/0128753 (2007-06-01), Oshima
patent: 2008/0042160 (2008-02-01), Shibata
patent: 2008/0083910 (2008-04-01), Scholz et al.
patent: 2008/0272463 (2008-11-01), Butcher et al.
patent: 08-335555 (1996-12-01), None
patent: 2003-517721 (2003-05-01), None
patent: 2004-193371 (2004-07-01), None
patent: 2005-009340 (2005-01-01), None
patent: WO 2005/008738 (2005-01-01), None
Kim et al., Fabrication of SAG-AIGaN/InGaN/AIGaN LEDs by mixed source HVPE with multi-sliding boat system phys, stat. sol. (c) 4, No. 1, pp. 29-32 (2007). published online Jan. 11, 2007.
R.G. Wilson et al., “Redistribution and activation of implanted S, Se, Te, Be, Mg, and C in GaN,” J. Vac. Sci. Technol. A 17(4), Jul./Aug. 1999, 1999 American Vacuum Society, pp. 1226-1229.
Japanese Office Action, with English translation, issued in Japanese Patent Application No. 2007-119379, dated Mar. 30, 2010.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming nitride film and nitride structure does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming nitride film and nitride structure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming nitride film and nitride structure will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2651144

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.