Methods of forming integrated circuit packages, and methods...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S015000, C438S107000, C438S108000, C438S118000, C438S119000, C438S120000, C438S612000, C257SE21508, C257SE21509

Reexamination Certificate

active

07977157

ABSTRACT:
Some embodiments include methods of assembling integrated circuit packages in which at least two different conductive layers are formed over a bond pad region of a semiconductor die, and in which a conductive projection associated with an interposer is bonded through a gold ball to an outermost of the at least two conductive layers. The conductive layers may comprise one or more of silver, gold, copper, chromium, nickel, palladium, platinum, tantalum, titanium, vanadium and tungsten. In some embodiments, the bond pad region may comprise aluminum, an inner of the conductive layers may comprise nickel, an outer of the conductive layers may comprise gold, the conductive projection associated with the interposer may comprise gold; and the thermosonic bonding may comprise gold-to-gold bonding of the interposer projection to a gold ball, and gold-to-gold bonding of the outer conductive layer to the gold ball. Some embodiments include integrated circuit packages.

REFERENCES:
patent: 5804876 (1998-09-01), Lake et al.
patent: 6107109 (2000-08-01), Akram et al.
patent: 6114239 (2000-09-01), Lake et al.
patent: 6506672 (2003-01-01), Dagenais et al.
patent: 6556030 (2003-04-01), Akram
patent: 7112471 (2006-09-01), Boon et al.
patent: 7427557 (2008-09-01), Rinne et al.
patent: 7671459 (2010-03-01), Corisis et al.
patent: 2003/0094481 (2003-05-01), Horie et al.
patent: 2003/0127747 (2003-07-01), Kajiwara et al.
patent: 2003/0139004 (2003-07-01), Yoshida
patent: 2004/0035840 (2004-02-01), Koopmans
patent: 2004/0126928 (2004-07-01), Kinsman et al.
patent: 2004/0152292 (2004-08-01), Babinetz et al.
patent: 2004/0164421 (2004-08-01), Tellkamp
patent: 2004/0229425 (2004-11-01), Yamaguchi et al.
patent: 2005/0017372 (2005-01-01), Lua et al.
patent: 2005/0151268 (2005-07-01), Boyd et al.
patent: 2005/0236709 (2005-10-01), Eng et al.
patent: 2006/0012024 (2006-01-01), Lin et al.
patent: 2006/0014316 (2006-01-01), Lin et al.
patent: 2006/0092079 (2006-05-01), de Rochemont
patent: 2006/0228825 (2006-10-01), Hembree
patent: 2006/0261446 (2006-11-01), Wood et al.
patent: 2007/0013067 (2007-01-01), Nishida et al.
patent: 2007/0020814 (2007-01-01), Hembree et al.
patent: 2008/0308931 (2008-12-01), Rinne et al.
patent: 10343180 (2005-04-01), None
patent: 2284928 (1995-06-01), None
patent: 2006110266 (2006-10-01), None
patent: 2006124295 (2006-11-01), None
Cheah, L.K., et al. “Thermosonic Flip Chip Assembly” Flip Chips Dot Com, Tutorial 9—Jun. 2007; reprinted Feb. 18, 2007; 7 pages.
Flip-Chip Assembly; http://www.siliconfareast.com/flipchipassy.htm; reprinted Feb. 16, 2007 2 pages.
Riley, George A “Introduction to Flip Chip: What, Why How” . Flip Chips Dot Com, Tutorial 1—Oct. 2000 5 pages.
PCTUS20080161169, WO, Aug. 13, 2008, Search Report.
PCTUS20080161169, WO, Aug. 13, 2008, Written Opinion.
Riley, George A. “Under Bump Metallization (UBM)” Flip Chips Dot Com, Tutorial 11—Sep. 2001; reprinted Feb. 16, 2007; 3 pages.
Riley, George A. “Electroless Nickel-Gold Flip Chip” Flip Chips Dot Com, Tutorial 7—Apr. 2001; reprinted Feb. 16, 2007; 4 pages.
Riley, George A. “Stud Bump Flip Chip” Flip Chips Dot Com, Tutorial 3—Dec. 2000; 5 pages.
Roth Laurie, S. et al. “Stud Bump Bonding:” http://ap.pennet.com/Article/Article—Display.cfm reprinted Feb. 13, 2007 6 pages.
Lee, Jihye et al., “Thermosonic Bonding of Lead-Free Solder with Metal Bump for Flip-Chip Bonding”, accepted (Aug. 18, 2004), Springer Boston, vol. 34, No. 1, 2005, pp. 96-102.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods of forming integrated circuit packages, and methods... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods of forming integrated circuit packages, and methods..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of forming integrated circuit packages, and methods... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2647176

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.