Insulated-gate field-effect transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S329000, C257S330000, C257S334000, C257SE29201, C257SE29260

Reexamination Certificate

active

07863678

ABSTRACT:
An IGFET that can be turned off when a reverse voltage is applied. Included is a semiconductor substrate having formed therein an n-type drain region, p-type first body region, p−-type second body region, n-type first source region, and n+-type second source region. Trenches etched in the substrate receive gate electrodes via gate insulators. The source electrode is in ohmic contact with both first and second source regions and in schottky barrier contact with the second body region.

REFERENCES:
patent: 7161208 (2007-01-01), Spring et al.
patent: 7176521 (2007-02-01), Kawamura et al.
patent: 7211837 (2007-05-01), Tomomatsu
patent: 7364971 (2008-04-01), Yamaguchi et al.
patent: 7417266 (2008-08-01), Li et al.
patent: 7541642 (2009-06-01), Kawamura et al.
patent: 7675111 (2010-03-01), Arai
patent: 7705396 (2010-04-01), Adan
patent: 7800187 (2010-09-01), Matsuura
patent: 2006/0289928 (2006-12-01), Takaya et al.
patent: 2007/0018243 (2007-01-01), Ono et al.
patent: 2009/0173995 (2009-07-01), Takahashi
patent: 07-015009 (1995-01-01), None
patent: 2003-133557 (2003-05-01), None
patent: 07-142722 (2003-06-01), None
patent: 2004-221218 (2004-08-01), None

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