Self-aligned metal-semiconductor alloy and metallization for...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257SE27060

Reexamination Certificate

active

07888742

ABSTRACT:
A lateral double-gate FET structure with sub-lithographic source and drain regions is disclosed. The sub-lithographic source and drain regions are defined by a sacrificial spacer. Self-aligned metal-semiconductor alloy and metal contacts are made to the sub-lithographic source and drain using conventional silicon processing.

REFERENCES:
patent: 5773331 (1998-06-01), Solomon et al.
patent: 6580132 (2003-06-01), Chan et al.
patent: 6642115 (2003-11-01), Cohen et al.
patent: 2005/0263797 (2005-12-01), Chan et al.
patent: 2006/0284249 (2006-12-01), Chen et al.

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