Semiconductor circuit including a long channel device and a...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S327000, C438S283000

Reexamination Certificate

active

07880236

ABSTRACT:
A semiconductor circuit is provided that includes a short channel device, and a long channel device that is electrically isolated from the short channel device. The long channel device comprises a plurality of first gate electrodes, a first source region adjacent one of the plurality of first gate electrodes, a first drain region adjacent another of the plurality of first gate electrodes, and a plurality of common source/drain regions positioned between adjacent ones of the plurality of first gate electrodes. The first gate electrodes each overlie portions of a layer of high-dielectric constant (k) gate insulator material. Each of the first gate electrodes are electrically coupled to at least one of the other first gate electrodes.

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patent: 1020921 (1999-12-01), None
E. Cartier et al., “Role of oxygen vacancies in VFB/Vt stability of pFET metals on HfO2,” VLSI Technology, Digest of Technical Papers, Jun. 14-16, 2005, pp. 230-231.
Guha et al., “Oxygen Vacancies in High Dielectric Constant Oxide-Semiconductor Films,” The American Physical Sockiey, Physical Review Letters, week ending May 11, 2007, pp. 196101-1-196101-4.

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