Semiconductor memory device and method of testing...

Details Semiconductor memory device and method of testing... Semiconductor memory device and method of testing...

2011-03-22

2011-03-22

Lam, David (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S233100, C365S194000, C365S233120

Reexamination Certificate

active

07911861

ABSTRACT:
A semiconductor memory device may include a memory that stores data, an input/output unit and a loopback circuit. The input/output unit inputs and outputs data of a predetermined number of bits in synchronization with a clock signal. The input/output unit may include, but is not limited to, the same number of data input/output terminals as the predetermined number of bits. The loopback circuit performs loopback operation to read data of the predetermined number of bits out of a first optional area of the memory and to write the data into a second optional area of the memory.

REFERENCES:
patent: 6671787 (2003-12-01), Kanda et al.
patent: 7590016 (2009-09-01), Ishikawa et al.
patent: 2007-317016 (2007-12-01), None

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