MOS device with varying trench depth

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S331000, C257S332000

Reexamination Certificate

active

07948029

ABSTRACT:
A semiconductor device includes a drain, an epitaxial layer overlaying the drain, a body disposed in the epitaxial layer, a source embedded in the body, a gate trench extending into the epitaxial layer, a gate disposed in the gate trench, an active region contact trench extending through the source, the active region contact trench having a varying contact trench depth, and an active region contact electrode disposed within the active region contact trench.

REFERENCES:
patent: 5378655 (1995-01-01), Hutchings et al.
patent: 5489787 (1996-02-01), Amaratunga et al.
patent: 5489797 (1996-02-01), Chan et al.
patent: 5614749 (1997-03-01), Ueno
patent: 5693569 (1997-12-01), Ueno
patent: 6188105 (2001-02-01), Kocon et al.
patent: 6251730 (2001-06-01), Luo
patent: 6433396 (2002-08-01), Kinzer
patent: 6498071 (2002-12-01), Hijzen et al.
patent: 6621107 (2003-09-01), Blanchard et al.
patent: 6686614 (2004-02-01), Tihanyi
patent: 6707127 (2004-03-01), Hshieh et al.
patent: 6710403 (2004-03-01), Sapp
patent: 6784505 (2004-08-01), Zeng
patent: 7005347 (2006-02-01), Bhalla et al.
patent: 7285822 (2007-10-01), Bhalla et al.
patent: 7446374 (2008-11-01), Thorup et al.
patent: 2001/0009800 (2001-07-01), Hijzen et al.
patent: 2003/0020134 (2003-01-01), Werner et al.
patent: 2004/0012050 (2004-01-01), Uno et al.
patent: 2004/0222457 (2004-11-01), Kim et al.
patent: 2005/0029584 (2005-02-01), Shiraishi et al.
patent: 2005/0167742 (2005-08-01), Challa et al.
patent: 2006/0071268 (2006-04-01), Tai et al.
patent: 2006/0202264 (2006-09-01), Bhalla et al.
patent: 2006/0209887 (2006-09-01), Bhalla et al.
patent: 2006/0214221 (2006-09-01), Challa et al.
patent: 2007/0075392 (2007-04-01), Pan et al.
patent: 2008/0246082 (2008-10-01), Hshieh
patent: 2009/0039456 (2009-02-01), Bhalla et al.
patent: 2009/0212358 (2009-08-01), Shiraishi et al.
Shannon, J.M., “Control of Schottky barrier height using highly doped surface layers”, Solid-State Electronics vol. 19, No. 6, p. 537-543, Jun. 1976.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

MOS device with varying trench depth does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with MOS device with varying trench depth, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and MOS device with varying trench depth will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2641340

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.