Methods for forming anti-reflection structures for CMOS...

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S060000, C438S061000, C438S062000, C438S063000, C438S064000, C257S059000, C257S072000, C257S436000

Reexamination Certificate

active

08003425

ABSTRACT:
Protuberances, having vertical and lateral dimensions less than the wavelength range of lights detectable by a photodiode, are formed at an optical interface between two layers having different refractive indices. The protuberances may be formed by employing self-assembling block copolymers that form an array of sublithographic features of a first polymeric block component within a matrix of a second polymeric block component. The pattern of the polymeric block component is transferred into a first optical layer to form an array of nanoscale protuberances. Alternately, conventional lithography may be employed to form protuberances having dimensions less than the wavelength of light. A second optical layer is formed directly on the protuberances of the first optical layer. The interface between the first and second optical layers has a graded refractive index, and provides high transmission of light with little reflection.

REFERENCES:
patent: 4478873 (1984-10-01), Masso et al.
patent: 4842824 (1989-06-01), Ono
patent: 4866696 (1989-09-01), Longman et al.
patent: 4928132 (1990-05-01), Pettigrew et al.
patent: 5007689 (1991-04-01), Kelly et al.
patent: 5122669 (1992-06-01), Herring et al.
patent: 5334342 (1994-08-01), Harker et al.
patent: 5548257 (1996-08-01), Caplan et al.
patent: 5573339 (1996-11-01), Woskov et al.
patent: 5779924 (1998-07-01), Krames et al.
patent: 5785426 (1998-07-01), Woskov et al.
patent: 6023063 (2000-02-01), Norton
patent: 6027956 (2000-02-01), Irissou
patent: 6037822 (2000-03-01), Rao et al.
patent: 6088505 (2000-07-01), Hobbs
patent: 6168965 (2001-01-01), Malinovich et al.
patent: 6175442 (2001-01-01), Booth, Jr. et al.
patent: 6185019 (2001-02-01), Hobbs et al.
patent: 6198098 (2001-03-01), Laou
patent: 6201257 (2001-03-01), Stettner et al.
patent: 6248645 (2001-06-01), Matsuoka et al.
patent: 6255038 (2001-07-01), Hobbs
patent: 6285817 (2001-09-01), Hobbs
patent: 6326649 (2001-12-01), Chang et al.
patent: 6326723 (2001-12-01), Raj et al.
patent: 6356389 (2002-03-01), Nilsen et al.
patent: 6384455 (2002-05-01), Nishigohri
patent: 6388372 (2002-05-01), Raj et al.
patent: 6537918 (2003-03-01), Ionov et al.
patent: 6570710 (2003-05-01), Nilsen et al.
patent: 6713404 (2004-03-01), Hishiro
patent: 6750912 (2004-06-01), Tennant et al.
patent: 6753584 (2004-06-01), Hu
patent: 6767689 (2004-07-01), Pavelchek et al.
patent: 6786632 (2004-09-01), Tanaka et al.
patent: 6891677 (2005-05-01), Nilsen et al.
patent: 7164514 (2007-01-01), Raguin
patent: 7208783 (2007-04-01), Palsule et al.
patent: 7211829 (2007-05-01), Yasukawa et al.
patent: 7242069 (2007-07-01), Bui et al.
patent: 7268948 (2007-09-01), Matsuo et al.
patent: 7351346 (2008-04-01), Little
patent: 7400439 (2008-07-01), Holman
patent: 7417268 (2008-08-01), Cazaux et al.
patent: 7541212 (2009-06-01), Oh
patent: 7556995 (2009-07-01), Coronel et al.
patent: 7576361 (2009-08-01), Agranov et al.
patent: 7601556 (2009-10-01), Wilson et al.
patent: 7608837 (2009-10-01), Roizin et al.
patent: 7655999 (2010-02-01), Bui et al.
patent: 7671384 (2010-03-01), Ema et al.
patent: 2001/0028035 (2001-10-01), Iida et al.
patent: 2002/0044351 (2002-04-01), Nilsen
patent: 2004/0027676 (2004-02-01), Nilsen
patent: 2004/0079962 (2004-04-01), Kanechika et al.
patent: 2004/0104351 (2004-06-01), Shibayama
patent: 2004/0169791 (2004-09-01), Nilsen et al.
patent: 2005/0042867 (2005-02-01), Sanchez et al.
patent: 2005/0179962 (2005-08-01), Williamson
patent: 2005/0189546 (2005-09-01), Yasukawa et al.
patent: 2007/0090419 (2007-04-01), Lee
patent: 2007/0158570 (2007-07-01), Ohta et al.
patent: 2008/0035941 (2008-02-01), Harle
patent: 2008/0108167 (2008-05-01), Abe et al.
patent: 2008/0121808 (2008-05-01), Roizin et al.
patent: 2008/0128846 (2008-06-01), Bui et al.
patent: 2008/0135898 (2008-06-01), Miura
patent: 2009/0286346 (2009-11-01), Adkisson et al.
patent: 0288140 (1988-02-01), None
patent: 0288140 (1988-02-01), None
patent: 0288140 (1988-02-01), None
patent: 62114139 (1987-05-01), None
patent: 2003275230 (2003-09-01), None
patent: 2003302532 (2003-10-01), None
patent: 2003344855 (2003-12-01), None
patent: 2004258364 (2004-09-01), None
patent: 2005099467 (2005-04-01), None
patent: 2004184298 (2006-07-01), None
patent: 2007156017 (2007-06-01), None
C.G. Bernhard, “Structural and functional adaptation in a visual system”, Endeavor, 26, 1967, pp. 79-84.
S.A. Boden et al., “Bio-Mimetic Subwavelength Surfaces for Near-Zero Reflection Sunrise to Sunset”, 2006 IEEE, pp. 1358-1361.
C. Max Hsieh et al., “Fabrication of Wafer-level Antireflective Structures in Optoelectronic Applications”, 2007 IEEE, pp. 185-186.
Paul F. Nealey et al., “Self-assembling resists for nanlithography”, IEDM Technical Digest, 2005, Digital Object Identifier 10.1109/IEDM.2005.1609349.
S. J. Wilson et al., “The optical properties of ‘moth eye’ antireflection surfaces”, Optica Acta, 192, vol. 29, No. 7, 1982, pp. 993-1009.
IBM Technical Disclosure Bulletin, “Mechanically Produced Anti-Reflection Surface”, Feb. 1979, p. 3793.
IBM Technical Disclosure Bulletin, “Solar Energy Absorber”, Jul. 1978, p. 834.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods for forming anti-reflection structures for CMOS... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods for forming anti-reflection structures for CMOS..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods for forming anti-reflection structures for CMOS... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2623352

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.