Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With microwave gas energizing means
Patent
1996-08-20
1999-12-28
Dang, Thi
Adhesive bonding and miscellaneous chemical manufacture
Differential fluid etching apparatus
With microwave gas energizing means
H05H 100
Patent
active
060076712
ABSTRACT:
The present invention relates to a hydrogen plasma down-flow processing method and a hydrogen plasma down-flow processing apparatus and has an object to provide a hydrogen plasma down-flow processing method and a hydrogen plasma down-flow processing apparatus ensuring that it is possible to make it difficult for hydrogen atoms to deposit and recombine on the internal wall of the apparatus. High speed hydrogen plasma processing can be realized by improving transfer efficiency of hydrogen atoms to the processing chamber. Moreover hydrogen plasma efficiency can also be improved by reducing influence of oxidation species such as OH radical and oxygen atom concentrations can be controlled as desired by keeping the change in hydrogen atom concentration small. The apparatus includes a vacuum chamber of which at least a part of the structural members exposed to a vacuum is made by silicon oxide. In a hydrogen plasma down-flow processing method, whereby the processed object is processed in the down-flow area, the plasma is generated from the gas including at least hydrogen. A processing object is processed by heating at least a part of the silicon oxide region to 443.degree. C. or higher.
REFERENCES:
patent: 4983254 (1991-01-01), Fujimura et al.
patent: 4987284 (1991-01-01), Fujimura et al.
patent: 5000819 (1991-03-01), Pedder et al.
patent: 5089441 (1992-02-01), Moslehi
patent: 5211796 (1993-05-01), Hansen
patent: 5306671 (1994-04-01), Ogawa et al.
Anthony et al., "In situ cleaning of silicon subsrate surfaces by remote plasma-excited hydrogen," J. Vac. Sci. Technol. B, vol. 7, No. 4, Jul./Aug. 1989, pp. 621-626.
Fujimura et al., "Ashing of Ion-Implanted Resist Layer," Japanese Journal of Applied Physics, vol. 28, No. 10, Oct. 1989, pp. 2130-2136.
Higashi et al., "Ideal hydrogen termination of the Si(111) surface," Appl. Phys. Lett., vol. 56, No. 7, Feb. 12, 1990, pp. 656-658.
Takahagi et al., "Control of the chemical reactivity of a silicon single-crystal surface using the chemical modification technique," J. Appl. Phys., vol. 68, No. 5, Sep. 1, 1990, pp. 2187-2191.
Kishimoto et al., "In situ RHEED Monitoring of Hydrogen Plasma Cleaning on Semiconductor Surfaces," Japanese Journal of Applied Physics, vol. 29, No. 10, Oct. 1990, pp. 2273-2276.
Cho et al., "Surface electronic states of low-temperature H-plasma cleaned Si(100)," Appl. Phys. Lett., vol. 59, No. 16, Oct. 14, 1991, pp. 1995-1997 .
Fujimura Shuzo
Kikuchi Jun
Dang Thi
Fujitsu Limited
LandOfFree
Method for hydrogen plasma down-flow processing and apparatus th does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for hydrogen plasma down-flow processing and apparatus th, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for hydrogen plasma down-flow processing and apparatus th will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2379922