Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent
1985-10-11
1987-02-10
LaRoche, Eugene R.
Optics: measuring and testing
Inspection of flaws or impurities
Having predetermined light transmission regions
364491, G01N 2100
Patent
active
046419675
ABSTRACT:
A method and apparatus for particle detection and position correlation that fuses separate detections of the same particle on adjacent scan lines into one. A first scan line on a surface is scanned with a laser beam and the scattered light detected. The detection generates address and amplitude data for each particle which is stored. The second line scanned also generates data which is stored in a buffer. Particle data between scan lines is compared. Data for new particles is stored, data for previous particles no longer detected being sent to computer storage, and data for the same particle being compared and only the one with larger amplitude being kept. The results in computer storage may be displayed as a wafer with those pixels lit which have particles.
REFERENCES:
patent: 4559603 (1985-12-01), Yoshikawa
Untitled article by A. Neukermans, dated Jan. 13, 1986.
LaRoche Eugene R.
Pascal Robert J.
Schneck Thomas
Tencor Instruments
LandOfFree
Particle position correlator and correlation method for a surfac does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Particle position correlator and correlation method for a surfac, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Particle position correlator and correlation method for a surfac will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2361035