Surface treatment for silicon substrates

Fishing – trapping – and vermin destroying

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437946, 437937, 1566431, H01L 21302

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active

055102778

ABSTRACT:
A method for desorbing the surface oxide on a silicon substrate is performed by implanting particles such at atomic or ionic hydrogen into the oxide layer on the silicon substrate. The oxide is then removed by breaking the bonds between the silicon and oxygen atoms within the oxide. The bonds may be broken by heating the substrate, for example. The temperature to which the substrate must be raised is substantially less than the temperature required to desorb an oxide layer that has not undergone an implantation step. In one particular example, the particles implanted into the oxide surface are hydrogen ions generated by electron cyclotron resonance.

REFERENCES:
patent: 5089441 (1992-02-01), Moslehi
patent: 5093695 (1992-03-01), Cunningham et al.
patent: 5308791 (1994-05-01), Horiike et al.
patent: 5310697 (1994-05-01), Kan et al.
patent: 5328558 (1994-07-01), Kawamura
patent: 5348912 (1994-09-01), Choquette et al.
"Low dislocation density GaAs on Si heteroepitaxy with atomic hydrogen irradiation for optoelectronic integration," Okada et al., Journal Of Applied Physics, vol. 73, No. 11, 1 Jun. 1993, pp. 7376-7384.
"Growth of Pseudomorphic In.sub.x Ga.sub.1-x As/GaP.sub.y As.sub.1-y multiple quantum well structures on GaAs by gas source molecular beam epitaxy," J. E. Cunningham et al., Journal of Crystal Growth, 127 (1993) pp. 184-188.
"monolithic Integration of GaAs/AlGaAs Multiple Quantum Well Modulators and Silicon Metal-Oxide--Semiconductor Transistors," K. W. Goossen et al. OSA Proceedings on Photonics In Switching, 1993, vol. 16, pp. 94-98.
"30 G.OMEGA. Isolation of GaAs Devices on Doped Si Via Undoped Buffer-Layers Application to Symmetric Self-Electrooptic Effect Devices," K. W. Goossen et al., IEEE Photonics Technology Letters, vol. 4, No. 7, Jul. 1992, pp. 763-765.
"Excitonic electroabsorption in extremely shallow quantum wells," K. W. Goossen et al., Applied Physics Letters, vol. 57, No. 24, 10 Dec., 1990, pp. 2582-2584.
"Low-Temperature Cleaning os Si and Growth of GaAs on Si By Hydrogen Plasma-Assisted Metalorganic Molecular-Beam Epitaxy," Y. Kunitsugu et al., Journal of Crystal Growth, vol. 95 (1989), pp. 91-95.
"New Low-temperature process for growth of GaAs on Si with Metal-organic molecular beam expitaxy assisted by a hydrogen plasma," I. Suemune et al., Applied Physics Letters, vol. 53, No. 22, 28 Nov. 1988, pp. 2173-2175.
"Persistent Channel Depletion Cuased by Hot Electron Trapping Effect in Selectively Doped n-AlGaAs/GaAs Structures," Kinoshita et al., Japanese Journal of Applied Physics, Part 1, vol. 24, No. 3 Mar. 1985, pp. 377-378.
"Molecular beam epitaxial growth and material properties of GaAs and AlGaAs on Si (100)," W. I. Wang, Applied Physics Letters, vol. 44, No. 12, 15 Jun. 1984, pp. 1149-1151.
"Leed Study Of The Stepped Surface Of Vicinal Si (100)," R. Kaplan, Surface Science, vol. 93, 1980, pp. 145-158.

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