Method for setting test voltages in a flash write mode

Details Method for setting test voltages in a flash write mode Method for setting test voltages in a flash write mode

1992-07-29

1993-08-31

LaRoche, Eugene R.

Static information storage and retrieval

Read/write circuit

365201, 365203, 371 211, G11C 700

Patent

active

052415007

ABSTRACT:
A method is provided for flash writing to multiple cells of a memory array. Initially, a first set of word lines, each of which controls connection of a memory cell of a first set of memory cells to a first bit line of a bit line pair, is turned on. The voltage between the two bit lines of the bit line pair is then equalized so that the charge on the first bit line of the bit line pair is higher than the charge on the second bit line of the bit line pair. Next, a sense amplifier attached to the bit line pair is turned on to sense a difference in charge between the bit line pair and to charge the first set of memory cells. Then a second set of word lines, each of which controls connection of a memory cell of a second set of memory cells to the second bit line is turned on. Finally, the word lines previously turned on are shut off and then the sense amplifier is shut off. Additionally, an apparatus is provided which allows for: turning on multiple word lines at one time, keeping an equalization means on until after at least one set of word lines have gone on, and controlling the operation of the sense amplifier to turn on and shut off at appropriate times.

REFERENCES:
patent: 4885748 (1989-12-01), Hoffmann et al.
patent: 4965769 (1990-10-01), Etoh et al.
patent: 4991139 (1991-02-01), Takahashi et al.
patent: 5003510 (1991-03-01), Kamisaki
patent: 5046049 (1991-09-01), Choi et al.
patent: 5140553 (1992-08-01), Choi et al.
IBM Technical Disclosure Bulletin "Multiple Word Line Selection For Reducing Semiconductor Memory Test Time", vol. 33, No. 5 (Oct. 1990).

Affiliated with

Also associated with

Rating

Method for setting test voltages in a flash write mode does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for setting test voltages in a flash write mode, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for setting test voltages in a flash write mode will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2302847