Timing comparator circuit for use in device testing apparatus

Details Timing comparator circuit for use in device testing apparatus Timing comparator circuit for use in device testing apparatus

1996-12-09

1998-03-24

Miska, Vit W.

Horology: time measuring systems or devices

Combined with disparate device

368113, 324 731, 371 211, 371 251, G04B 4700, G04F 800, G01R 3128

Patent

active

057320470

ABSTRACT:
A timing comparator circuit for use in device testing apparatus is provided which can eliminate, in the window comparison mode, an off time during which a failure cannot be detected. There are provided first and second window strobe pulse generating circuits S/RFF1 and S/RFF2 for alternately generating window strobe pulses, first and second failure detecting circuits 5a and 5b for detecting whether a failure signal exists or not in the output signals from a level comparator 2 during the pulse duration of each window strobe pulse supplied thereto from the first and the second window strobe pulse generating circuits, and first and second interleave circuits.

REFERENCES:
patent: 4070565 (1978-01-01), Borrelli
patent: 4108358 (1978-08-01), Niemaszyk
patent: 4994732 (1991-02-01), Jeffrey et al.
patent: 5212443 (1993-05-01), West et al.
patent: 5311486 (1994-05-01), Alton et al.

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