Method and apparatus for analyzing fine grained substances

Details Method and apparatus for analyzing fine grained substances Method and apparatus for analyzing fine grained substances

1975-11-19

1977-07-19

Smith, Alfred E.

Radiant energy

Inspection of solids or liquids by charged particles

Electron probe type

250307, G01N 2304

Patent

active

040371018

ABSTRACT:
A rock specimen is step scanned in an electron probe x-ray microanalyzer. A plurality of x-ray spectrometers (for example three) forming a part of said electron probe x-ray microanalyzer simultaneously detect characteristic x-rays corresponding to three elements at each scanning point on the rock specimen. The concentration of each element is calculated from the output signals of said plurality of x-ray spectrometers and the calculated elemental concentrations are then converted into atomic ratios accordingly. From this information, the type of mineral at each scanning point is designated by a character which is recorded on a display means in synchronism with the step scanning so as to display a mineral map of the specimen being examined.

REFERENCES:
patent: 3204095 (1965-03-01), Watanabe
patent: 3229087 (1966-01-01), Shapiro
patent: 3479506 (1969-11-01), Durfler
patent: 3733483 (1973-05-01), Green et al.
patent: 3733484 (1973-05-01), Bayard
patent: 3909612 (1975-09-01), Gibbard

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