Programmable integrated circuit having a test circuit for testin

Details Programmable integrated circuit having a test circuit for testin Programmable integrated circuit having a test circuit for testin

1997-09-17

2000-10-10

Tokar, Michael

Electronic digital logic circuitry

Multifunctional or programmable

Array

326 38, H03K 19177

Patent

active

061305545

ABSTRACT:
A programmable integrated circuit (see FIG. 13) includes a plurality of routing resources including collinearly extending routing wire segments and a test circuit for testing the integrity of the routing wire segments. The routing resource structures include a plurality of unprogrammed antifuses disposed between routing wire segments and a plurality of transistors disposed electrically in parallel with a corresponding respective one of the antifuses. The test circuit has a common node that may be coupled to a selected one of the routing resource structures for testing. In test mode, the test circuit detects whether a current flows through the selected routing resource structure and in response provides either a digital low value or a digital high value on an output node.

REFERENCES:
patent: 4758745 (1988-07-01), Elgamal et al.
patent: 4857774 (1989-08-01), El-Ayat et al.
patent: 4910417 (1990-03-01), El-Gamal et al.
patent: 5010258 (1991-04-01), Usami et al.
patent: 5053909 (1991-10-01), Suzuki et al.
patent: 5055718 (1991-10-01), Galbraith et al.
patent: 5083718 (1992-01-01), El-Ayat et al.
patent: 5132563 (1992-07-01), Fujii et al.
patent: 5196724 (1993-03-01), Gordon et al.
patent: 5208530 (1993-05-01), El-Ayat et al.
patent: 5220213 (1993-06-01), Chan et al.
patent: 5243226 (1993-09-01), Chan
patent: 5302546 (1994-04-01), Gordon et al.
patent: 5304871 (1994-04-01), Dharmarajan et al.
patent: 5315182 (1994-05-01), Sakashita et al.
patent: 5327024 (1994-07-01), Cox
patent: 5336986 (1994-08-01), Allman
patent: 5341030 (1994-08-01), Galbraith
patent: 5347519 (1994-09-01), Cooke et al.
patent: 5367207 (1994-11-01), Goetting et al.
patent: 5391942 (1995-02-01), El-Ayat et al.
patent: 5397939 (1995-03-01), Gordon et al.
patent: 5416367 (1995-05-01), Chan et al.
patent: 5424655 (1995-06-01), Chua
patent: 5455525 (1995-10-01), Ho et al.
patent: 5469396 (1995-11-01), Eltoukhy
patent: 5477167 (1995-12-01), Chua
patent: 5479113 (1995-12-01), Gamal et al.
patent: 5495181 (1996-02-01), Kolze
patent: 5498979 (1996-03-01), Parlour et al.
patent: 5502315 (1996-03-01), Chua et al.
patent: 5525909 (1996-06-01), McCollum
patent: 5526312 (1996-06-01), Eltoukhy
patent: 5528600 (1996-06-01), El Ayat et al.
patent: 5534793 (1996-07-01), Galbraith
patent: 5537056 (1996-07-01), McCollum
patent: 5544070 (1996-08-01), Cox et al.
patent: 5557136 (1996-09-01), Gordon et al.
patent: 5572476 (1996-11-01), Eltoukhy
patent: 5589782 (1996-12-01), Sharpe-Geisler
patent: 5594361 (1997-01-01), Campbell
patent: 5614818 (1997-03-01), El Ayat et al.
patent: 5654649 (1997-08-01), Chua
patent: 5712578 (1998-01-01), Conley
S. Brown, et al., "Field Programmable Gate Arrays", pp. 1-43 and 88-202 (1992), no month.
S. Trimberger, "Field Programmable Gate Array Technology", pp. 1-14 and 98-170 (1994), no month.
D. Pellerin, et al., "Practical Design Using Programmable Logic", pp. 84-98 (1991), No month.
Advanced Micro Devices, PAL Device Book and Design Guide, pp. 2-236 through 2-247 (1993), No month.
QuickLogic, Data Book, pp. 1-5 through 2-11 and 6-3 through 6-18 (1995), no month.
Acatel, FPGA Data Book and Design Guide, pp. ix-xv, 1-5 through 1-34, 1-51 through 1-101, 1-153 through 1-222, 3-1 through 4-56 (1995), no month.
Xilinx, "The Programmable Gate Array Design Hand Book", First Edition, pp.1-9 through 2-73 (1986).

Affiliated with

Also associated with

Rating

Programmable integrated circuit having a test circuit for testin does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Programmable integrated circuit having a test circuit for testin, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Programmable integrated circuit having a test circuit for testin will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2259653