Thin films of ABO.sub.3 with excess A-site and B-site modifiers

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Other Related Categories

437235, 4273762, 427377, 427380, H01L 2144

Type

Patent

Status

active

Patent number

057233616

Description

ABSTRACT:
A method for fabricating an integrate circuit capacitor having a dielectric layer comprising BST with excess A-site and B-site materials such as barium and titanium added. An organometallic or metallic soap precursor solution is prepared comprising a stock solution of BST of greater than 99.999% purity blended with excess A-site and B-site materials such as barium and titanium such that the barium is in the range of 0.01-100 mol %, and such that the titanium is in the range of 0.01-100 mol %. A xylene exchange is then performed to adjust the viscosity of the solution for spin-on application to a substrate. The precursor solution is spun on a first electrode, dried at 400.degree. C. for 2 to 10 minutes, then annealed at 650.degree. C. to 800.degree. C. for about an hour to form a layer of BST with excess titanium. A second electrode is deposited, patterned, and annealed at between 650.degree. C. to 800.degree. C. for about 30 minutes. The resultant capacitor exhibits an enlarged dielectric constant with little change in leakage current.

REFERENCES:
patent: 3002861 (1961-10-01), Suchoff
patent: 4670243 (1987-06-01), Wilson et al.
patent: 4677083 (1987-06-01), Uedaira et al.
patent: 4946710 (1990-08-01), Miller et al.
patent: 4963390 (1990-10-01), Lipeles et al.
patent: 5122923 (1992-06-01), Matsubara et al.
patent: 5160762 (1992-11-01), Brand et al.
patent: 5272341 (1993-12-01), Micheli et al.
patent: 5391393 (1995-02-01), Maniar
E. Fujii, et al.; ULSI DRAM Technology with Ba.sub.0.7 Sr.sub.0.3 TiO.sub.3 Film of 1.3nm Equivalent SiO.sub.2 Thickness and 10.sup.-9 A/cm.sup.2 Leakage Current; IEDM Technical Digest, 1992; pp. 10.3.1-10.3.4.
Kuniaki Koyama, et al.; A Stacked Capacitor with (Ba.sub.x Sr.sub.1-x) TiO.sub.3 For 256 DRAM; IEDM, Dec. 1991; pp. 32.1.1-32.1.4.
W.D. Kingery, et al.; Introduction to Ceramics, Second Edition; pp. 969-971, 1976.
G.M.Vest, et al.; Synthesis of Metallo-Organic Compounds For MOD Powders and Films; Materials Research Society Symp. Proc. vol. 60, 1986; pp. 35-42.
Robert W. Vest, et al.; PbTiO.sub.3 Films From Metalloorganic Precursors; IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, vol. 35, No. 6, Nov. 1988; pp. 711-717.
M. Azuma, et al.; Electrical Characteristics of High Dielectric Constant Materials For Integrated Ferroelectrics; ISIF, 1992; pp. 109-117.
J.V. Mantese, et al.; Metalorganic Deposition (MOD): A Nonvacuum, Spin-on, Liquid-Based, Thin Film Method; MRS Bulletin, Oct. 1989; pp. 48-53.
B.M. Melnick, et al.; Process Optimization and Characterization of Device Worthy Sol-Gel Based PZT For Ferroelectric Memories; Ferroelectrics, 1990, vol. 109, 1990; pp. 1-23.
R.C. Buchanan, Ceramic Materials for Electronics, Marcel Dekker, Inc. 1986 pp. 79-138.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Thin films of ABO.sub.3 with excess A-site and B-site modifiers does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Thin films of ABO.sub.3 with excess A-site and B-site modifiers , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thin films of ABO.sub.3 with excess A-site and B-site modifiers will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2246969

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.