Method of making a semiconductor with copper passivating film

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438633, 438638, 438687, 438692, 438626, H01L 214763, H01L 2144, H01L 21302, H01L 21461

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active

061142344

ABSTRACT:
A method of making a semiconductor with a passivating film for copper interconnects includes the step of etching a first set of trench openings within a second oxide layer and then through an etch stop layer that has been deposited over a first oxide layer on a semiconductor substrate. At least a second set of openings are etched in the first oxide layer within the bounds defined by each of a first set of openings. A copper layer is deposited and a passivating film formed on top of the deposited copper layer by depositing one of either a chromate or chromite on the deposited copper layer and forming a respective copper chromate or copper chromite composition. The passivating film is chemically mechanically polished with a slurry containing a respective nitric acid when the passivating film is formed from a chromite and ammonium hydroxide when the passivating film is formed from a chromate.

REFERENCES:
patent: 5780358 (1998-07-01), Zhou et al.
Carpio et al, "Initial study on copper CMP slurry chemistries", Thin Solid Films 266: 238-244, 1995.
Aruna Bahadur, "Study of film growth on copper in chromate solution by a radioactive tracer technique", Journal of Materials Science Letters, vol. 17 No. 8; pp. 701-704, Apr. 1998.

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