Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Patent
1999-06-23
2000-09-05
Chaudhari, Chandra
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
438633, 438638, 438687, 438692, 438626, H01L 214763, H01L 2144, H01L 21302, H01L 21461
Patent
active
061142344
ABSTRACT:
A method of making a semiconductor with a passivating film for copper interconnects includes the step of etching a first set of trench openings within a second oxide layer and then through an etch stop layer that has been deposited over a first oxide layer on a semiconductor substrate. At least a second set of openings are etched in the first oxide layer within the bounds defined by each of a first set of openings. A copper layer is deposited and a passivating film formed on top of the deposited copper layer by depositing one of either a chromate or chromite on the deposited copper layer and forming a respective copper chromate or copper chromite composition. The passivating film is chemically mechanically polished with a slurry containing a respective nitric acid when the passivating film is formed from a chromite and ammonium hydroxide when the passivating film is formed from a chromate.
REFERENCES:
patent: 5780358 (1998-07-01), Zhou et al.
Carpio et al, "Initial study on copper CMP slurry chemistries", Thin Solid Films 266: 238-244, 1995.
Aruna Bahadur, "Study of film growth on copper in chromate solution by a radioactive tracer technique", Journal of Materials Science Letters, vol. 17 No. 8; pp. 701-704, Apr. 1998.
Merchant Sailesh M.
Misra Sudhanshu
Roy Pradip K.
Chaudhari Chandra
Lucent Technologies - Inc.
Pham Thanhha
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