Process for forming titanium silicide local interconnect

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437201, 148DIG15, 148DIG19, 148DIG147, H01L 2144

Patent

active

055433618

ABSTRACT:
A process for forming a titanium silicide local interconnect between electrodes separated by a dielectric insulator on an integrated circuit. A first layer of titanium is formed on the insulator, and a layer of silicon is formed on the titanium. The silicon layer is masked and etched to form a silicon strip connecting the electrodes, and an overlying second layer of titanium is formed over the silicon strip. The titanium and silicon are heated to form nonsilicidized titanium over a strip of titanium silicide, and the nonsilicidized titanium is removed.

REFERENCES:
patent: 4589196 (1986-05-01), Anderson
patent: 4641417 (1987-02-01), McDavid
patent: 4690730 (1987-09-01), Tang et al.
patent: 4746219 (1988-05-01), Holloway et al.
patent: 4751198 (1988-06-01), Anderson
patent: 4777150 (1988-10-01), DeNeuville et al.
patent: 4870033 (1989-09-01), Hotta et al.
patent: 4873204 (1989-10-01), Wong et al.
patent: 4886764 (1989-12-01), Miller et al.
patent: 4904620 (1990-02-01), Scmmitz
patent: 4923822 (1990-05-01), Wang et al.
patent: 4994402 (1991-02-01), Chiu
patent: 5001082 (1991-03-01), Goodwin-Johansson
J. F. Jongste, et al., Appl. Surf. Sci., 38 (1989) 57 "Formation of TiSi.sub.2 in a Nitrogen Ambient".
Translation of JP 60-167354 cited in a prior action.
Y. Koh et al., J. Vac. Sci. and Technol., B3, 6 (1985) 1715 "Self Aligned TiSi.sub.2 For Bipolar Applications".
S. Wolf, "Silicon Processing For The VLSIEAR" vol. II, 1990, pp. 162-169, 172-173.
M. T. Lin et al., J. Electrochem Soc., 133, 11 (1986) 2386 "Trilayer Structure For TiSi.sub.2 Formation".

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for forming titanium silicide local interconnect does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for forming titanium silicide local interconnect, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for forming titanium silicide local interconnect will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2190954

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.