Semiconductor memory device having test circuit

Details Semiconductor memory device having test circuit Semiconductor memory device having test circuit

1994-01-25

1995-08-22

Nelms, David C.

Static information storage and retrieval

Read/write circuit

Testing

36518905, 371 211, G11C 2900

Patent

active

054446619

ABSTRACT:
A semiconductor memory device is disclosed which has a data output circuit including a first node, a second node, first and second transistors connected in series between the first node and a potential line, third and fourth transistors connected in series between the first node and the potential line, fifth and sixth transistors connected in series between the second node and the potential line, seventh and eighth transistors connected in series between the second node and the potential-line, one of the first and third transistors being driven in response to a data signal read from a selected memory cell and one of the fifth and seventh transistors being driven in response to an inverted data signal of the data signal in a normal mode while turning one of the second and fourth transistor and one of the sixth and eighth transistors ON, both of the first and third transistors being driven in response to the data signal and both of the fifth and seventh transistors being driven in response to the inverted data signal while all the second, fourth, sixth and eighth transistors ON. The output circuit further includes an output logic circuit driving an output terminal to one of first and second logic levels when the first and second nods have logic levels different from each other and to a high impedance when the first and second nodes have logic levels equal to each other.

REFERENCES:
patent: 4982380 (1991-01-01), Koike

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