Plasma etch process and TiSi.sub.x layers made using the process

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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257751, 257757, 257758, 438664, 438643, 438974, H01L 2144

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active

056271050

ABSTRACT:
A method for making an improved metal silicide layer on a silicon substrate by plasma bombardment of the substrate with Ne ions to remove the native oxide without damage or significant implantation of Ne atoms into said silicon, depositing a metal layer over the Ne etched surface and then rapidly thermally causing the metal layer to react with the underlying silicon.

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Article by D. Pramanik, A.N. Saxena, O.K. Wu, G.G. Peterson and M. Tanielian, entitled "Influence of the interfacial oxide on titanium silicide formation by rapid thermal annealing", published in J. Vac. Sci. Technol. B2 (4) Oct.-Dec. 1984, pp. 775-780.
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Article by N. Parekh, H. Roede, A.A. Bos, A.G.M. Jonkers and R. Verhaar, entitled "Characterization and implementation of self-aligned TiSi.sub.2 in submicrometer CMOS Technology", published in IEEE Transactions on Electron Devices, vol. 36, No. 1, Jan. 1991.
Article by C. Lu, J. Sung, R. Liu, N. Tsai, R. Singh, S. Hillenius and H. Kirsch, entitled "Process limitation and device design tradeoffs of self-aligned TiSi.sub.2 junction formation in submicrometer CMOS devices", published in IEEE Transactions on Electron Devices, vol. 38, No. 2, Feb. 1991.
Article by I. Kondo, T. Yoneyama, K. Kondo and O. Takenaka, entitled "Effects of different pretreatments on the surface structure of silicon and the adhesion of metal films", published in J. Vac. Sci. Technol., A 10 (5), Sep./Oct. 1992, pp. 3166-3169.

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