Method to improve interlevel dielectric planarization using SOG

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438699, H01L 2144, H01L 2148

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active

056271042

ABSTRACT:
A method is provided for forming a substantially planarized surface of an integrated circuit, and an integrated circuit formed according to the same. A conductive area is formed over a portion of a dielectric region. A first spin-on-glass layer is formed over the conductive area and exposed dielectric region. A second spin-on-glass layer is formed over the first spin-on-glass layer; wherein the second spin-on-glass layer has a slower etch rate than the first spin-on-glass layer. A partial etchback of the first and second spin-on-glass layers is performed forming a substantially planar surface.

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