Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Patent
1995-05-11
1997-05-06
Bowers, Jr., Charles L.
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
438164, 438407, 438479, 438486, 117 8, H01L 21322, H01L 2184
Patent
active
056270860
ABSTRACT:
A thin-film semiconductor crystal is formed by depositing a thin film of amorphous silicon on a substrate, introducing ions selectively into a predetermined region of the thin film of amorphous silicon, and growing a single semiconductor crystal in the thin film of amorphous silicon by way of solid-phase crystal growth. A semiconductor device which employs the thin-film semiconductor crystal has a channel in the region where the ions are selectively introduced.
REFERENCES:
patent: 3900345 (1975-08-01), Lesk
patent: 4814292 (1989-03-01), Sasaki et al.
patent: 4904611 (1990-02-01), Chiang et al.
patent: 5264383 (1993-11-01), Young
patent: 5283205 (1994-02-01), Sakamoto
patent: 5290712 (1994-03-01), Sato et al.
patent: 5318661 (1994-06-01), Kumomi
patent: 5352291 (1994-10-01), Zhang et al.
patent: 5457058 (1995-10-01), Yonehara
T. Noguchi, et al., J. Electrochem. Soc., 134(7) (1987) (1771) "Polysilicon Film Obtained by Si.sup.+ Implant. and Annealing".
Y.Y. Wang et al., SPIE, vol. 530 (1985) 70 "The Influence of Ion Implantation on SPE of a-Si . . . ".
M.K. Hatalis et al., J. Appl. Phys., 63,(7) (1988) 2260 "Polysilicon by Low Temp. Annealing of LPCVD a-Si Films".
S. Wolf & R.N. Tauber, "Silicon Processing for the VLSI Era" vol. 1, 1986, p. 179.
I.-W. Wu, et al., J. Appl. Phys., 65(10) (1989) 4036 "Retardation of Nucleation Rate by Si Implant. of LPCVD a-Si".
P. Revesz, et al., J. Appl. Phys., 49(10) (1978) 5199 "Epitaxial Regrowth of Ar-Implanted a-Si".
Translation of JP 4-255213 (Hamada).
Bowers Jr. Charles L.
Radomsky Leon
Sony Corporation
LandOfFree
Method of forming thin-film single crystal for semiconductor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of forming thin-film single crystal for semiconductor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming thin-film single crystal for semiconductor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2132146