Integrated circuitry comprising halo regions and LDD regions

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257371, 257376, H01L 2976

Patent

active

061246166

ABSTRACT:
A method of forming CMOS integrated circuitry includes, a) providing a series of gate lines over a semiconductor substrate, a first gate line being positioned relative to an area of the substrate for formation of an NMOS transistor, a second gate line being positioned relative to an area of the substrate for formation of a PMOS transistor; b) masking the second gate line and the PMOS substrate area while conducting a p-type halo ion implant into the NMOS substrate area adjacent the first gate line, the p-type halo ion implant being conducted at a first energy level to provide a p-type first impurity concentration at a first depth within the NMOS substrate area; and c) in a common step, blanket ion implanting phosphorus into both the NMOS substrate area and the PMOS substrate area adjacent the first and the second gate lines to form both NMOS LDD regions and PMOS n-type halo regions, respectively, the phosphorus implant being conducted at a second energy level to provide an n-type second impurity concentration at a second depth within both the PMOS substrate area and the NMOS substrate area, the first energy level and the first depth being greater than the second energy level and the second depth, respectively. Methods of forming memory and other CMOS integrated circuitry are also disclosed involving optimization of different NMOS transistors.

REFERENCES:
patent: 4342149 (1982-08-01), Jacobs et al.
patent: 4474624 (1984-10-01), Matthwes
patent: 4530150 (1985-07-01), Shirato
patent: 4745083 (1988-05-01), Huie
patent: 4753898 (1988-06-01), Parrillo et al.
patent: 4764477 (1988-08-01), Chang et al.
patent: 4771014 (1988-09-01), Liou et al.
patent: 4876213 (1989-10-01), Pfiester
patent: 4933994 (1990-06-01), Orban
patent: 4950617 (1990-08-01), Kunagai et al.
patent: 4968639 (1990-11-01), Bergonzoni
patent: 4997782 (1991-03-01), Bergonzoni
patent: 5015595 (1991-05-01), Wollesen
patent: 5024960 (1991-06-01), Haken
patent: 5036019 (1991-07-01), Yamane et al.
patent: 5106768 (1992-04-01), Kuo
patent: 5141890 (1992-08-01), Haken
patent: 5166087 (1992-11-01), Kakimoto et al.
patent: 5170232 (1992-12-01), Narita
patent: 5217910 (1993-06-01), Shimizu et al.
patent: 5286665 (1994-02-01), Muragishi et al.
patent: 5340756 (1994-08-01), Nagayasu
patent: 5365110 (1994-11-01), Matsuoka
patent: 5385857 (1995-01-01), Solo De Zaldivar
patent: 5395787 (1995-03-01), Lee et al.
patent: 5405791 (1995-04-01), Ahmad et al.
patent: 5413945 (1995-05-01), Chien et al.
patent: 5422506 (1995-06-01), Zamapian
patent: 5424571 (1995-06-01), Lion
patent: 5449937 (1995-09-01), Arimura et al.
patent: 5500379 (1996-03-01), Odake et al.
patent: 5532176 (1996-07-01), Katada et al.
patent: 5534449 (1996-07-01), Dennison et al.
patent: 5554869 (1996-09-01), Chang
patent: 5670397 (1997-09-01), Chang et al.
patent: 5683927 (1997-11-01), Dennison et al.
patent: 5736440 (1998-04-01), Manning
patent: 5747855 (1998-05-01), Dennison et al.
patent: 5776806 (1998-07-01), Dennison et al.
S. M. Sze, "Semiconductor Devices Physics and Technology," pp. 306-307 (1985).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Integrated circuitry comprising halo regions and LDD regions does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated circuitry comprising halo regions and LDD regions, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuitry comprising halo regions and LDD regions will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2102332

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.