Cleaning gas

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

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Details

438905, 510188, 510245, 510382, 216 58, 216104, H01L 21302

Patent

active

061470066

ABSTRACT:
A cleaning gas which is employed to remove an unnecessary deposited material formed in a thin film forming apparatus by thermal decomposition of pentaethoxytantalum or tetraethoxysilane without damaging a reactor, tools, parts and piping of a silicon oxide film-forming apparatus or a tantalum oxide film-forming apparatus. The cleaning gas comprises HF gas and at least one of an oxygen-containing gas, a fluorine gas, a chlorine fluoride gas, a bromine fluoride gas and an iodine fluoride gas.

REFERENCES:
patent: 5679215 (1997-10-01), Barnes et al.
patent: 6043162 (2000-03-01), Shimizu et al.

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