Process for formation of capacitor electrode for semiconductor d

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

216 6, 437919, G03F 740, H01L 2170

Patent

active

056983751

ABSTRACT:
The invention discloses a process for formation of a capacitor for a semiconductor device. The upper node electrode is supported by side wall spacers and a central pole, so that the supporting strength may be reinforced and the surface area may be increased. During the formation of a contact hole, a first side wall spacer is formed, and, by utilizing the first side wall spacer, a contact hole is opened with a greater margin. The upper and lower node electrodes are of a tunnel structure. The central pole of the node electrodes is provided with a hole in it, so that a conductive material may be filled into the hole to form a connecting portion. This connecting portion connects the node electrodes of the capacitor to a source/drain region which is formed on a semiconductor substrate. A thin dielectric film is deposited on the surface of the node electrode, and a plate electrode is formed thereupon, thereby completing the formation of the capacitor.

REFERENCES:
patent: 3365378 (1968-01-01), Maissel et al.
patent: 3653898 (1972-04-01), Shaw
patent: 5162253 (1992-11-01), Takeuchi
patent: 5164337 (1992-11-01), Ogawa et al.
patent: 5444010 (1995-08-01), Park et al.
N. Matsuo, et al.; "Tunnel Structured Stacked Capacitor Cell (TSSC) for 64 MBit dRams"; 1991 International Conference on Solid State Devices and Materials, Yokohama; pp. 475-477.
N. Shinmura, et al.; "A Stacked Capacitor Cell With Ring Structure"; 1990 Intern'l Conf. on Solid State Devices & Material, Sendai; pp. 833-834.
Hyundai Electronics Industries Co.,Ltd.;Hyundai literature pp. 399-400.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for formation of capacitor electrode for semiconductor d does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for formation of capacitor electrode for semiconductor d, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for formation of capacitor electrode for semiconductor d will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-204363

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.