Method for preparation of transmission electron microscope sampl

Radiant energy – Inspection of solids or liquids by charged particles – Methods

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25044211, 2504911, H01J 3720

Patent

active

055720269

ABSTRACT:
A method for processing sample material for use with transmission electron microscopes utilizes a sheet mesh for supporting the sample material during irradiation processing. The sheet mesh is formed of a metallic sheet material having a single opening provided in a central portion thereof, a circumferential edge portion of the opening is tapered from one side of the sheet mesh through to the other and the angle of the taper corresponds to the angle of irradiation. Position determining portions are provided on the sheet mesh to assure reliable positioning of the sample material. Also, the method provides a for preparation of the sample material including a protective layer formed over a membrane layer for allowing adhesion of membrane layers made of materials which would otherwise degrade the adhesion layer during processing.

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patent: 5440123 (1995-08-01), Ikeda

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