Semiconductor substrate and process for production thereof

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438409, 438413, 438753, H01L 214763

Patent

active

061366846

ABSTRACT:
A process for producing a semiconductor substrate is provided which comprises providing a first member having a porous monocrystalline silicon layer and a nonporous monocrystalline silicon layer grown thereon, laminating the nonporous silicon layer of the first member onto a second member with interposition of an insulation layer provided on at least one lamination face of the first member and the second member, and removing the porous monocrystalline silicon layer by etching, wherein the nonporous monocrystalline silicon layer is grown at a low growth rate controlled such that the density of remaining pores on the crystal growth face is not more than 1000/cm.sup.2 at the time when the nonporous silicon layer has grown to a thickness corresponding to the diameter of the pores of the porous monocrystalline silicon layer.

REFERENCES:
patent: 5278092 (1994-01-01), Sato
patent: 5278093 (1994-01-01), Yonehara
patent: 5290712 (1994-03-01), Sato et al.
patent: 5320907 (1994-06-01), Sato
patent: 5363793 (1994-11-01), Sato
patent: 5403771 (1995-04-01), Nishida et al.
patent: 5457058 (1995-10-01), Yonehara
patent: 5559042 (1996-09-01), Yamazaki et al.
patent: 5670411 (1997-09-01), Yonehara et al.
patent: 5679475 (1997-10-01), Yamagata et al.
A. Uiilir, Jr., "Electrolytic Shaping of Germanium and Silicon", The Bell System Technical Journal, vol. XXXV 1956, pp. 333-347.
T. Unagami et al., "Structure of Porous Silicon Layer and Heat-Treatment Effect", Journal of the Electrochemical Society, vol. 125, No. 8, Aug. 1978, pp. 1339-1344.
K. Izumi et al., "C.M.O.S Devices Fabricated on Buried SiO.sub.2 Layers Formed By Oxygen Implantation Into Silicon", Electronics Letters, vol. 14, No. 18 Aug. 31, 1978, pp. 593-594.
K. Imai, "A New Dielectric Isolation Method Using Porous Silicon", Solid-State Electronics, vol. 24, Mar. 13, 1980, pp. 159-164.
H. Takai et al., "Isolation of Silicon Films Grown On Porous Silicon Layer", Journal of Electronic Materials, vol. 12, No. 6, Nov. 1983, pp. 973-982.
J.B. Lasky et al., "Silicon-on-Insulator (SOI) by Bonding and Etch-Back", Int'l. Electron Devices Meeting, Dec. 1-4, 1985, Washington, D.C., pp. 684-687.
H. Takai et al., "Porous silicon layers and its oxide for the silicon-on-insulator structure", Journal of Applied Physics, vol. 60, No. 1, Jul. 1986, pp. 222-225.
R. Herino et al., "Porosity and Pore Size Distributions of Porous Silicon Layers", Journal of Electrochemical Society, vol. 134, No. 8A, Aug. 1987, pp. 1994-2000.
L. Vescan, "Low-Pressure Vapor-Phase Epitaxy of Silicon On Porous Silicon", Materials Letters, vol. 7, No. 3, Sep. 1988, pp. 94-98.
C. Oules et al., "Silicon on Insulator Structures Obtained by Epitaxial Growth Of Silicon Over Porous Silicon", Journal of Electrochemical Society vol. 139, No. 11, Nov. 1992, pp. 3595-3599.
T. Yonehara et al., "Epitaxial layer transfer by bond and etch back of porous Si", Applied Physics Letters, vol. 64, No. 16, Apr. 18, 1994, pp. 2108-2110.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor substrate and process for production thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor substrate and process for production thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor substrate and process for production thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1963260

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.