Stress cell for a scanning probe microscope

Details Stress cell for a scanning probe microscope Stress cell for a scanning probe microscope

1995-03-07

1996-03-19

Berman, Jack

Radiant energy

Inspection of solids or liquids by charged particles

Analyte supports

250306, 73105, 73817, H01J 3720

Patent

active

055005357

ABSTRACT:
A novel stress cell for applying stress in-situ to a sample in a scanning probe microscope. It has a loading clamp mounted on a sample stage which is magnetically mounted to a scanning tunneling microscope or atomic force microscope. A wedge is placed on top of the sample stage. A clamp holds a sample with its two arms pulling the sample against the wedge. It is fastened by a micrometer which is driven by a motor. A force-sensor is placed between the clamp and the stage to measure the force applied. This cell provides a superior stability and straightforward operation procedure for studying stress related problems in materials.

REFERENCES:
patent: 3759082 (1973-09-01), Provenzano et al.
patent: 5103095 (1992-04-01), Elings et al.

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