Static information storage and retrieval – Read/write circuit – Bad bit
Patent
1984-02-13
1986-08-12
Moffitt, James W.
Static information storage and retrieval
Read/write circuit
Bad bit
365 96, G11C 1140
Patent
active
046060138
ABSTRACT:
A redundancy-secured semiconductor memory including a matrix of regular memory cells consisting of a plurality of regular memory cell trains, an extra memory cell train for redundant construction, and a taking-over system for enabling the extra memory cell train to take over the function of a faulty regular memory cell train including a faulty bit, wherein the taking-over system comprises a decoder and a monostable latching circuit connected to the decoder through a current conducting element capable of breakage in response to when one of the regular memory cell trains comes to include a faulty bit, thereby enabling the monostable latching circuit to fix its output to the low logic potential. Thus, the faulty regular memory cell train is kept in an unselected state without DC power consumption.
REFERENCES:
patent: 3765002 (1973-10-01), Basse
patent: 4459685 (1984-07-01), Sud et al.
Schuster, "On-Chip Redundancy Scheme", IBM Technical Disclosure Bulletin, vol. 14, No. 5, Oct. 1971, pp. 1513-1514.
Tolley et al., "72K RAM Stands Up to Hard and Soft Errors", Electronics, vol. 55, No. 12, Jun. 16, 1982, pp. 147-151.
Fitzgerald et al., "Circuit Implementation of Fusible Redundant Addresses on RAMs for Productivity Enhancement", IBM Journal of Research Development, vol. 24, No. 3, May 1980, pp. 291-298.
Gossage Glenn A.
Mitsubishi Denki & Kabushiki Kaisha
Moffitt James W.
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